Avant performs reliability checks for all of its products. Some of the check activities are performed in-house; some are at subcontractor's sites; some are subcontracted to officially authorized organizations or companies. Generally, reliability tests are categorized into 3 categories: Environmental Stress, Mechanical Stress, and Electrical Stress.

Environmental Stress

Test Item

Referred standard

Test conditions Purpose of the test
Temperature cycling
  • MIL-STD-883C-1010.7
  • EIAJ ED-4701B-131
- 65 °C to 150 °C Check device's resistance to the cycling change of temperature from high extreme to low extreme.
Thermal shock
  • MIL-STD-883C-1011-7
  • EIAJ ED-4701-B-141
0 °C to 100 °C Check device's resistance to abrupt, rapid change in temperature.
High-temperature storage
  • MIL-STD-883C-1008.2
  • EIAJ ED-4701B-111
Tamb= 150 °C Check device's resistance to high-temperature storage environment.
Low temperature storage
  • EIAJ ED-4701B-112
Tamb= -65 °C Check device's resistance to low-temperature storage environment.
Moisture resistance
  • EIAJ ED-4701B-121
Tamb= 85 °C, 85% RH Check device's resistance to an environment with high temperature and high relative humidity, for a long period of operation and storage.
Salt atmosphere
  • EIAJ ED-4701B-144
  • MIL-STD-202F-101D
35 °C, 5% brine spray, 48 hours Check device's resistance to corrosion in a salty environment, such as costal area.
Pressure cooker
  • EIAJ ED-4701B-123
2 atmospheric pressures, 121 °C. Check device's resistance to accelerated humidity change.
Resistance to high temperature during soldering
  • EIAJ ED-4701-A-132, A-133
260 °C, 10 seconds (solder bath) Check the device's resistance to high temperature during soldering.
Resistance to chemical corrosion from solvents
  • EIAJ ED-4701C-131
  • MIL-STD-883C-2015-8
Isopropyl alcohol, 10 minutes Check device marking's resistance to solvent. (only applicable to printed marking; laser marking may be used for some devices.)
High-temperature operating
  • EIAJ ED-4701D-101
  • MIL-STD-883C-1005-6
Tamb= 125 °C, steady operation Check device's durability of operation with both electrical stress and thermal stress applied for a long period of time.
Moisture resistance ( with bias)
  • EIAJ ED-4701B-122
Tamb= 85 °C, 85% RH, rated voltage applied Check the device's durability in an environment with high relative humidity.


Mechanical Stress

Test Item

Referred standard

Test conditions Purpose of the test
Vibration variable frequency
  • MIL-STD-883C-2007-1

  • EIAJ ED-4701A-121

  • 100 Hz to 2K Hz.
  • 4 minutes/back and forth
  • 4 times for each of X, Y, Z (at 20 G)
Check device's resistance to vibration during transportation or operation.
Vibration fatigue
  • MIL-STD-883C-2005-2
  • EIAJ ED-4701A-121
60Hz, 20G, 32 hours, for each of X, Y, Z Check device's resistance to vibration during transportation or operation.
Mechanical shock
  • EIAJ ED-4701A-124
75 cm, 3 times, 3 falls for each of X, Y, and Z. Check device's resistance to shocks which the device may experience during installation, transportation, or operation.
Lead integrity
  • EIAJ ED-4701A-111
  • MIL-STD-883C-2004-5
Tension 0.3 Kg, 10 seconds. Check device's resistance to forces to which the device's leads may be subjected during installation or operation.
Lead integrity
  • EIAJ ED-4701A-111
  • MIL-STD-883C-2004-5
90° bending, 2 cycles Check device's resistance to forces to which the device's leads may be subjected during installation or operation..
Solderability
  • EIAJ ED-4701A-131
  • MIL-STD-202E-208E
230 °C, 5 seconds, flux used Check device lead's solderability.


Electrical Stress

Test Item

Referred standard

Test conditions Purpose of the test
ESD (Human Body Model)
  • EIA JESD 22--A114-13

4000 volts Check device's resistance to electrostatic charge.
ESD (Machine Model)
  • EIA JESD 22-A115
300 volts Check device's resistance to electrostatic charge.
Latch-up
  • EIAJ ED-4701A-124
 250 mA Check device's resistance to latch-up triggering current.